000			01920nam a22001697a 4500
008			230511b |||||||| |||| 00| 0 eng d
020			_a9783658359256 - pbk
100			_aTaudt, Christopher
245			_aDevelopment and characterization of a dispersion-encoded method for low-coherence interferometry
260			_aWiesbaden, Germany : _bSpringer Vieweg, _c@2022
300			_axxiii, 163p.; illus.; _bincludes bibliography
520			_aThis Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 aem with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden
650			_a1. Interferometry
650			_a2. Lasers
650			_a3. Photonics
942			_cBK
999			_c8961 _d8961