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	1.	New approaches to image processing based failure analysis of nano-scale ULSI devices / Zeev Zalevsky, Pavel Livshits, Eran Gur. by Zalevsky, Zeev Livshits, Pavel Gur, Eran Series: Micro & nano technologies Material type: Text; Format: print ; Literary form: Not fiction Publisher: Amsterdam : Elsevier/William Andrew, [2014]Copyright date: ♭2014 Online resources: Publisher description Availability: Items available for loan: Kwara State University Library (3)Call number: TK7874 .Z35 2014, ... Place hold Add to cart (remove)
	2.	Sputtering materials for VLSI and thin film devices / Jaydeep Sarkar. by Sarkar, Jaydeep (Materials scientist) Material type: Text; Format: print ; Literary form: Not fiction Publisher: Waltham [Mass.] : William Andrew, 2014 Availability: Items available for loan: Kwara State University Library (3)Call number: T695 .27 2014, ... Place hold Add to cart (remove)

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