Microwave de-embedding : from theory to applications / Giovanni Crupi, University of Messina, Italy, Dominique M.M.-P. Schreurs, KU Leuven, Leuven, Belgium.
Material type: TextPublisher: Amsterdam ; Boston : Elsevier/AP, Academic Press is an imprint of Elsevier, [2014]Copyright date: �2014Description: xxiv, 456 pages : illustrations ; 25 cmContent type:- text
- unmediated
- volume
- 9780124017009
- 0124017002
- 621.38132 23
- TK7876 .M5257 2014
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
Books | Kwara State University Library | TK7876 .C78 2014 (Browse shelf(Opens below)) | Available | 015216-01 | ||
Books | Kwara State University Library | TK7876 .C78 2014 (Browse shelf(Opens below)) | Available | 015216-02 | ||
Books | Kwara State University Library | TK7876 .C78 2014 (Browse shelf(Opens below)) | Available | 015216-03 |
Includes bibliographical references and index.
A clear-cut introduction to the de-embedding concept: less is more / Givanni Crupi, Dominique M.M.-P. Schreurs, Alina Caddemi -- Millimeter- wave characterization of silicon devices under small-signal regime: instruments and measurement methodologies / Gilles Dambrine -- Characterization and modeling of high-frequency active devices oriented to high-sensitivity subsystems design / Ernesto Limiti, Walter Ciccognani, Sergio Colangeli -- High-frequency and microwave electromagnetic analysis calibration and de-embedding / James C. Rautio -- Large-signal time-domain waveform-based transistor modeling / Itcho Angelov, Gustavo Avolio, Dominique M.M. -P. Schreurs -- Measuring and characterization nonlinear radio-frequency systems / Wendy Van Moer, Lieve Lauwers, Kurt Barbé -- Behavioral models for microwave circuit design / José C. Pedro, Telmo R. Cunha -- Electromagnetic-analysis-based transitor de-embedding and related radio-frequency amplifier design / Manuel Yarlequé, Dominique M.M.-P. Schruers, Bart Nauwelaers, Davide Resca, Giorgio Vannini -- Nonlinear embedding and de-embedding: theory and applications / Antonio Raffo, Valeria Vadalà, Giorgio Vannini.
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